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gallium sda
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Authored by Joe on Jun 8 2016, 9:58 AM.
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F4142442: gallium sda
Jun 8 2016, 9:58 AM
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gallium:~# smartctl -a /dev/sda
smartctl 5.41 2011-06-09 r3365 [x86_64-linux-3.2.0-75-generic] (local build)
Copyright (C) 2002-11 by Bruce Allen, http://smartmontools.sourceforge.net
=== START OF INFORMATION SECTION ===
Device Model: SAMSUNG HE502HJ
Serial Number: S2B6J90ZC10733
LU WWN Device Id: 5 0024e9 20425171f
Firmware Version: 1AJ30001
User Capacity: 500,107,862,016 bytes [500 GB]
Sector Size: 512 bytes logical/physical
Device is: Not in smartctl database [for details use: -P showall]
ATA Version is: 8
ATA Standard is: ATA-8-ACS revision 6
Local Time is: Wed Jun 8 09:57:07 2016 UTC
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x82) Offline data collection activity
was completed without error.
Auto Offline Data Collection: Enabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 4740) seconds.
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 79) minutes.
SCT capabilities: (0x003f) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x002f 100 100 051 Pre-fail Always - 314
2 Throughput_Performance 0x0026 056 056 000 Old_age Always - 4311
3 Spin_Up_Time 0x0023 083 083 025 Pre-fail Always - 5200
4 Start_Stop_Count 0x0032 100 100 000 Old_age Always - 20
5 Reallocated_Sector_Ct 0x0033 252 252 010 Pre-fail Always - 0
7 Seek_Error_Rate 0x002e 252 252 051 Old_age Always - 0
8 Seek_Time_Performance 0x0024 252 252 015 Old_age Offline - 0
9 Power_On_Hours 0x0032 100 100 000 Old_age Always - 45691
10 Spin_Retry_Count 0x0032 252 252 051 Old_age Always - 0
11 Calibration_Retry_Count 0x0032 252 252 000 Old_age Always - 0
12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 20
13 Read_Soft_Error_Rate 0x003a 100 100 000 Old_age Always - 0
191 G-Sense_Error_Rate 0x0022 252 252 000 Old_age Always - 0
192 Power-Off_Retract_Count 0x0022 252 252 000 Old_age Always - 0
193 Load_Cycle_Count 0x0032 100 100 000 Old_age Always - 20
194 Temperature_Celsius 0x0002 064 064 000 Old_age Always - 24 (Min/Max 16/32)
195 Hardware_ECC_Recovered 0x003a 100 100 000 Old_age Always - 0
196 Reallocated_Event_Count 0x0032 252 252 000 Old_age Always - 0
197 Current_Pending_Sector 0x0032 252 100 000 Old_age Always - 0
198 Offline_Uncorrectable 0x0030 252 252 000 Old_age Offline - 0
199 UDMA_CRC_Error_Count 0x0036 200 200 000 Old_age Always - 0
200 Multi_Zone_Error_Rate 0x002a 100 100 000 Old_age Always - 0
240 Head_Flying_Hours 0x0032 100 100 000 Old_age Always - 45691
241 Total_LBAs_Written 0x0032 096 094 000 Old_age Always - 6315330
242 Total_LBAs_Read 0x0032 097 095 000 Old_age Always - 4912351
254 Free_Fall_Sensor 0x0032 100 100 000 Old_age Always - 1
SMART Error Log Version: 1
ATA Error Count: 1
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.
Error 1 occurred at disk power-on lifetime: 45691 hours (1903 days + 19 hours)
When the command that caused the error occurred, the device was in a reserved state.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 ce 32 fa 6a e4 Error: WP at LBA = 0x046afa32 = 74119730
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
ca 00 90 70 fa 84 e5 08 11:55:49.665 WRITE DMA
27 00 00 00 00 00 e0 08 11:55:49.665 READ NATIVE MAX ADDRESS EXT
ec 00 00 00 00 00 a0 08 11:55:49.665 IDENTIFY DEVICE
ef 03 46 00 00 00 a0 08 11:55:49.665 SET FEATURES [Set transfer mode]
27 00 00 00 00 00 e0 08 11:55:49.665 READ NATIVE MAX ADDRESS EXT
SMART Self-test log structure revision number 1
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Extended offline Completed without error 00% 2 -
# 2 Short offline Completed without error 00% 0 -
Note: selective self-test log revision number (0) not 1 implies that no selective self-test has ever been run
SMART Selective self-test log data structure revision number 0
Note: revision number not 1 implies that no selective self-test has ever been run
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Completed [00% left] (0-65535)
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.